Galaxy® XL

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AUTOMATED INCLUSION MAPPING OF LARGER STONES

The Galaxy® is the world-leading product family for the fully automated detection and mapping of internal features in rough diamonds. The Galaxy XL is the Galaxy system model that enables the fully automated detection and mapping of the internal features of your large rough diamonds (of up to ~200 carats). The Galaxy XL maps all the inclusions in the diamond regardless of their type, size, and location. This unique process is performed quickly and automatically without the need for any “windows” being opened or other pre-processing of the rough stone.

Key Benefits

  • Handles all types of inclusions whether transparent or black - piques, cracks (“gletzes”), bubbles, clouds, etc.
  • Detects inclusions up to VS-I3 classifications
  • Scans most diamonds including, frosted and even slightly coated, regardless of level of impurities
  • Scans diamonds up to ~ 200ct..
  • Generates an accurate easily understandable 3D model of the rough diamond with all inclusions clearly mapped
  • Productivity dictated by stone size: 1-2 hours per stone, regardless of level of impurities
  • Fully integrated with Sarine's Advisor software

Technical Specifications

  • Stone sizes
    H - Up to 34mm
    W - Up to 28mm
  • Stone weight
    Up to ~180ct.
  • Productivity
    Dictated by stone size: 1-2 hours per stone
  • Detection ability (inclusion type)
    VS2 to I3
  • Weight (machine only)
    180kg (400 Ibs)
  • Power Consumption
    1.0 kW/h