Galaxy® Ultra

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ULTRA INCLUSION MAPPING UP TO VVS

The Galaxy® Ultra detects and maps internal features in rough diamonds up to micron level resolution – for the first time ever up to VVS classification. Unlike alternative techniques, this groundbreaking system enables the automatic, comprehensive and time-efficient scanning of a rough diamond to unprecedented levels of accuracy and is designed to directly output its data to the Advisor® platform. This enables true optimization of the value of the polished stone, based on all the relevant C’s, including, for the first time ever, the Clarity, all this virtually up to the VVS classification.

Key Benefits

  • Harmless to all types of inclusions whether transparent or black - piques, cracks (“gletzes”), bubbles, clouds, etc.
  • Detects inclusions down to micron level resolution - virtually up to VVS classification
  • Scans most diamonds including, frosted and even slightly coated, regardless of level of impurities
  • Scans diamonds up to ~ 20.00ct
  • Generates an accurate easily understandable 3D model of the rough diamond with inclusions clearly mapped
  • Productivity dictated by designated area of stone selected for high-res inspection
  • Fully integrated with Sarine’s Advisor software

Technical Specifications

  • Stone Sizes
    H - Up to 14 mm
    W - Up to 12.5 mm
  • Productivity
    ~20 stones per day (Depending on stone size) in Ultra mode, 4 stones per hour in Galaxy mode
  • Detection Ability
    VVS to I3
  • Electrical Inputs
    220V, 5A, 50 Hertz
  • Power Consumption
    1.0 kW/h
  • Dimensions
    L: 1.15m (3'9"); w:0.75m (2'6"); H: 1.65m (5'5") not including the PC&LCD stand
  • Weight
    ~400kg (881 Ibs)