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ULTRA INCLUSION MAPPING UP TO IF
The Galaxy® Ultra detects and maps internal features in rough diamonds up to single micron resolution – for the first time ever up to I3 classification. Unlike alternative techniques, this groundbreaking system enables the automatic, comprehensive and time-efficient scanning of a rough diamond to unprecedented levels of accuracy and is designed to directly output its data to the Advisor® platform. This enables true optimization of the value of the polished stone, based on all the relevant C’s, including, for the first time ever, the Clarity, all this virtually up to the IF classification.
Sensitive to various types of inclusions whether transparent or black - piques, cracks (“gletzes”), bubbles, clouds, etc.
Detects inclusions down to single micron resolution - virtually up to IF classification
Scans most diamonds including, frosted and even slightly coated, regardless of level of impurities
Scans diamonds up to ~ 20.00ct
Generates an easily understandable 3D model of the rough diamond with inclusions clearly mapped
Productivity dictated by designated area of stone selected for high-res inspection
Fully integrated with Sarine’s Advisor platform: Precise high resolution (virtual IF) rough planning based on internal features without any human errors
Advanced optimization of polished diamonds taking into consideration all relevant information – Carat, Clarity (virtually up to IF level) and Cut Includes Stone Management System to efficiently control the entire process
H - Up to 14 mm W - Up to 12.5 mm
~20 stones per day (Depending on stone size) in Ultra mode, 4 stones per hour in Galaxy mode
VVS to I3
220V, 5A, 50 Hertz
L: 1.15m (3'9"); w:0.75m (2'6"); H: 1.65m (5'5") not including the PC&LCD stand