Interested in Sarine products? Complete the form and we’ll contact you shortly
ULTRA INCLUSION MAPPING UP TO VVS
The Galaxy® Ultra detects and maps internal features in rough diamonds up to micron level resolution – for the first time ever up to VVS classification. Unlike alternative techniques, this groundbreaking system enables the automatic, comprehensive and time-efficient scanning of a rough diamond to unprecedented levels of accuracy and is designed to directly output its data to the Advisor® platform. This enables true optimization of the value of the polished stone, based on all the relevant C’s, including, for the first time ever, the Clarity, all this virtually up to the VVS classification.
Harmless to all types of inclusions whether transparent or black - piques, cracks (“gletzes”), bubbles, clouds, etc.
Detects inclusions down to micron level resolution - virtually up to VVS classification
Scans most diamonds including, frosted and even slightly coated, regardless of level of impurities
Scans diamonds up to ~ 20.00ct
Generates an accurate easily understandable 3D model of the rough diamond with inclusions clearly mapped
Productivity dictated by designated area of stone selected for high-res inspection
Fully integrated with Sarine’s Advisor software
H - Up to 14 mm
W - Up to 12.5 mm
~20 stones per day (Depending on stone size) in Ultra mode, 4 stones per hour in Galaxy mode
VVS to I3
220V, 5A, 50 Hertz
L: 1.15m (3'9"); w:0.75m (2'6"); H: 1.65m (5'5") not including the PC&LCD stand